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Measurement of the in-plane thermal conductivity by steady-state infrared thermography

机译:通过稳态测量面内热导率   红外热成像

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摘要

We demonstrate a simple and quick method for the measurement of the in-planethermal conductance of thin films via steady-state IR thermography. The filmsare suspended above a hole in an opaque substrate and heated by a homogeneousvisible light source. The temperature distribution of the thin films iscaptured via infrared microscopy and fitted to the analytical expressionobtained for the specific hole geometry in order to obtain the in-plane thermalconductivity. For thin films of poly(3,4-ethylenedioxythiophene):polystyrenesulfonate post-treated with ethylene glycol and of polyimide we findconductivities of 1.0 W/mK and 0.4 W/mK at room temperature, respectively.These results are in very good agreement with literature values, validating themethod developed.
机译:我们演示了一种通过稳态红外热成像技术测量薄膜的平面内热导的简单快捷的方法。将膜悬浮在不透明基材上的孔上方,并用均匀可见光源加热。通过红外显微镜捕获薄膜的温度分布,并将其拟合为针对特定孔几何形状而获得的解析表达式,以获得面内导热率。对于用乙二醇和聚酰亚胺进行后处理的聚(3,4-乙撑二氧噻吩):聚苯乙烯磺酸盐薄膜和聚酰亚胺薄膜,我们在室温下的电导率分别为1.0 W / mK和0.4 W / mK,这些结果与文献非常吻合值,验证开发的方法。

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